EMC EMI Near-Field Probe Set 9KHz–7GHz Half Shield Antenna 5Pcs
EMC EMI Near-Field Probe Set — 5-Piece Half Shield Antenna Kit (9KHz–7GHz)
Pinpoint electromagnetic interference (EMI) sources with confidence using this professional-grade near-field probe set. Designed for electronics engineers, PCB designers, and RF technicians, this 5-piece kit covers a wide frequency range of 9KHz to 7GHz, making it an indispensable tool for EMC troubleshooting, circuit debugging, and signal integrity analysis.
Key Features
- Wide Frequency Range: Covers 9KHz to 7GHz, suitable for a broad range of EMC/EMI diagnostic tasks.
- Premium PCB Construction: Each probe features a 1.6mm thick dual-layer PCB design with 1.5 oz copper thickness and full-process tin spraying for excellent signal performance across both high and low frequency currents.
- Half Shield Design: The half-shield near-field antenna configuration enables precise localization of interference sources within electronic assemblies and PCB layouts.
- Compatible with Noise Preamplifiers: Works seamlessly alongside noise preamplifiers for measuring phase noise and spectral components with greater accuracy.
- 5-Probe Variety Set: Five different probes included to cover a range of measurement scenarios, ensuring you always have the right tool for the job — and backups when you need them.
- Compact & Portable: Small, lightweight form factor makes these probes easy to carry, store, and deploy in the lab or field.
- Male Thread Connector: Standard male thread termination for easy integration with existing test equipment setups.
Specifications
| Frequency Range | 9KHz – 7GHz |
| PCB Thickness | 1.6mm Dual-Layer |
| Copper Thickness | 1.5 oz |
| Surface Finish | Full-Process Tin Sprayed |
| Connector Type | Male Thread |
| Material | PCB |
| Pieces Included | 5 Probes |
| Country of Origin | Made in China |
Package Contents
- 5 × Near-Field Probes
Note: Only the above package contents are included. Other products not included. Color may vary slightly due to screen settings. Measurement tolerance is ±1–3cm.
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Frequently Asked Questions
Q: What is this EMC EMI near-field probe set used for?
A: This near-field probe set is designed to help engineers and technicians locate and identify potential electromagnetic interference (EMI) sources within electronic circuits and PCB assemblies. By scanning near the surface of a PCB or electronic component, the probes detect localized EMI emissions across a wide frequency range of 9KHz to 7GHz, making them ideal for EMC pre-compliance testing, signal integrity analysis, and RF debugging.
Q: Can these probes be used with a spectrum analyzer or noise preamplifier?
A: Yes. These near-field probes are compatible with spectrum analyzers and noise preamplifiers. Using them with a preamplifier enhances sensitivity, allowing you to detect lower-level phase noise and spectral components more accurately during measurements.
Q: What connector type do these probes use, and are they compatible with standard test equipment?
A: The probes feature a standard male thread connector, which is widely compatible with most commercial spectrum analyzers, oscilloscopes with RF inputs, and other RF test equipment. Always check your equipment's connector specification before use and use an appropriate adapter if needed.
Q: Why are five probes included in the set?
A: The 5-probe kit provides a variety of probe geometries and sizes, each suited for different measurement scenarios — from broad-area EMI scanning to pinpoint localization of interference hotspots on dense PCB layouts. Having multiple probes also means you have backups available for replacement when needed, making the set highly practical for professional lab use.
Production & Packaging Notice
To maintain high stock availability and fast shipping times, our items are sourced from multiple verified manufacturing facilities. While the core quality, materials, and product specifications remain identical, you may notice slight variations in the packaging design, manufacturing origin, or the wording of the printed instructions.